Total found: 39 tools for sale. Click a column title to sort, or click an item no. for detail information.

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Item Category Manufacturer Equipment Model Wafer Year Status Market Type

7555 Metrology & Inspection Applied Materials
 COMPLUS 3T COMPLUS 3T
 300mm
 2003
 LIVE! Exchange
 Iine
6598 Metrology & Inspection Applied Materials
 Patterned Wafer Inspection Compass 200
 200mm
 2001
 LIVE! Exchange

7551 Metrology & Inspection AXIC
 P-1000 P-1000
 Unspecified
 2000
 LIVE! Exchange
 Precision 1000
6350 Metrology & Inspection AXIC
 Thin Film Measurement System XRF Axic 100-II
 200mm
 1998
 LIVE! Exchange

6014 Metrology & Inspection AXIC
 Laser Reflectometer Tyger
 150mm
 1998
 LIVE! Exchange

4597 Metrology & Inspection AXIC
 Precision 1000 XRF Precision 1000 XRF
 150mm
LIVE! Exchange

1119 Metrology & Inspection AXIC
 X-Ray Measurement System 100
 150mm
 1990
 LIVE! Exchange
 AXIC 100
1118 Metrology & Inspection AXIC
 Thin Film Measurement System XRF Axic 100-II
 200mm
 1998
 LIVE! Exchange

5704 Metrology & Inspection Bio-Rad
 Overlay Metrology Tool Q5/Q6
 200mm
LIVE! Exchange
 BioRad Q5/Q6
5703 Metrology & Inspection Bio-Rad
 Overlay Metrology Tool Q7/Q8
 200mm
LIVE! Exchange
 BioRad Q7/Q8
4588 Metrology & Inspection Bio-Rad
 Q2 Questor System Q2+
 150mm
 1995
 LIVE! Exchange

7417 Metrology & Inspection FEI
 FIB 200 FIB 200
 Unspecified
 1996
 LIVE! Exchange
 Front of Tool
5082 Metrology & Inspection Gatan
 Digital imaging system 688
 Unspecified
 1997
 LIVE! 10 Nov 2010, 15:00 PT
 Gatan Digital Imaging System
6651 Metrology & Inspection Hewlett Packard
 Semiconductor Process Control System HP 4062
 150mm
 1996
 LIVE! Exchange
 HP 4062
5881 Metrology & Inspection Hewlett Packard
 Spectrophotometer
200mm
 1997
 LIVE! Exchange

7531 Metrology & Inspection Hitachi
 S-7840 S-7840
 200mm
 2002
 LIVE! Exchange

5712 Metrology & Inspection Hitachi
 SEM S-7000
 150mm
 1989
 LIVE! Exchange
 Hitachi S-7000
5803 Metrology & Inspection JEOL
 SEM Review JWS-7500E
 200mm
 1997
 LIVE! Exchange
 System in Cleenroom
6700 Metrology & Inspection Kevex
 X-Ray Fluorescence Omicron XRF
 200mm
 1996
 LIVE! Exchange
 Main Pic
5023 Metrology & Inspection Kevex
 X-Ray Fluorescence Omicron XRF
 200mm
 1996
 LIVE! Exchange
 Main Pic
7085 Metrology & Inspection KLA-Tencor
 Wafer Inspection - Bare SP1 TB1
 200mm
 2000
 LIVE! Exchange

6366 Metrology & Inspection KLA-Tencor
 UV-1050 UV-1050
 Unspecified
LIVE! Exchange

5854 Metrology & Inspection KLA-Tencor
 Wafer Inspection AIT-8000
 200mm
 1996
 LIVE! Exchange

6460 Metrology & Inspection Leica
 StereoSCan 420 StereoSCan 420
 Unspecified
 1994
 LIVE! Exchange

6365 Metrology & Inspection LEO ENGINEERING
 LTA-550 LTA-550
 Unspecified
LIVE! Exchange

5240 Metrology & Inspection Micro-Vu
 Optical Comparator H14
 Unspecified
 1992
 LIVE! Exchange
 Pic 1
7353 Metrology & Inspection Nanometrics
 ATLAS -
 300mm
LIVE! Exchange
 Picture
4589 Metrology & Inspection Nanometrics
 Nanospec 2100 Nanospec 2100
 150mm
 2000
 LIVE! Exchange

2723 Metrology & Inspection Nanometrics
 Nanospec 4150
 200mm
 1998
 LIVE! 01 Dec 2010, 15:00 PT

2677 Metrology & Inspection Nanometrics
 Nanospec 4000 UV
 Unspecified
LIVE! 01 Dec 2010, 15:00 PT

2674 Metrology & Inspection Nanometrics
 Nanospec 210
 Unspecified
LIVE! 01 Dec 2010, 15:00 PT

2672 Metrology & Inspection Nanometrics
 Nanospec 181
 Unspecified
LIVE! 01 Dec 2010, 15:00 PT

2671 Metrology & Inspection Nanometrics
 Nanoline 50/50-2
 Unspecified
LIVE! 01 Dec 2010, 15:00 PT

6364 Metrology & Inspection Plasmos
 SD4000 SD4000
 Unspecified
LIVE! Exchange

6284 Metrology & Inspection Rudolph Technologies
 Wafer Inspection Metapulse 200
 200mm
 1998
 LIVE! Exchange
 System in Cleenroom
5833 Metrology & Inspection Sensys Instruments
 Wafer Inspection SMS-2000
 200mm
 2000
 LIVE! Exchange
 Main Body in Cleenroom
6370 Metrology & Inspection Therma-Wave
 OP2600 OP2600
 Unspecified
LIVE! Exchange

5892 Metrology & Inspection Woolam
 Ellipsometer VU-302
 200mm
 2001
 LIVE! Exchange
 Control Panel & Process Area
7632 Metrology & Inspection KLA-Tencor
 KLA-Tencor Surfscan 6220 Non-Patterned Wafer Defe Wafer Defect/Particle Inspection System
 200mm



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